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http://cio.repositorioinstitucional.mx/jspui/handle/1002/687| Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope | |
| JESUS CANTU VALLE FRANCISCO RUIZ ZEPEDA FERNANDO MENDOZA SANTOYO MIGUEL JOSE Y YACAMAN | |
| En Embargo | |
| 30-06-2019 | |
| Atribución-NoComercial-SinDerivadas | |
| In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200 Fisshown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5 μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing(σ) and versus fringe width(W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses. | |
| 30-06-2014 | |
| Artículo | |
| CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA | |
| Aparece en las colecciones: | Articulos Arbitrados 2014 |