Please use this identifier to cite or link to this item: http://cio.repositorioinstitucional.mx/jspui/handle/1002/687
Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope
JESUS CANTU VALLE
FRANCISCO RUIZ ZEPEDA
FERNANDO MENDOZA SANTOYO
MIGUEL JOSE Y YACAMAN
En Embargo
30-06-2019
Atribución-NoComercial-SinDerivadas
In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200 Fisshown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5 μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing(σ) and versus fringe width(W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.
30-06-2014
Artículo
CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA
Appears in Collections:Articulos Arbitrados 2014