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http://cio.repositorioinstitucional.mx/jspui/handle/1002/686| Application of the carré algorithm and high speed interferometer technique for fast surface profile measurement | |
| DAVID ASAEL GUTIERREZ HERNANDEZ CARLOS PEREZ LOPEZ FERNANDO MENDOZA SANTOYO | |
| En Embargo | |
| 30-04-2019 | |
| Atribución-NoComercial-SinDerivadas | |
| The measurement of a surface profile by using High Speed Electronic Speckle Pattern Interferometry (HS-ESPI) is presented. It is realized by the temporal phase shifting algorithm proposed by Carré. The HS-ESPI is configured to 4000 frames per second (fps). Traditionally, temporal phase shifting techniques employed piezoelectric components to retrieve the optical phase of the measured object. In this work the retrieved optical phase comes directly from the object itself which is under a vibration condition. The measurement is done without the need of any piezoelectric component, any electronic synchronization or any other external component | |
| 2014-04 | |
| Artículo | |
| CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA | |
| Aparece en las colecciones: | Articulos Arbitrados 2014 |