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http://cio.repositorioinstitucional.mx/jspui/handle/1002/563| Polarimetric Characterization of Bismuth Thin Films Deposited by Laser Ablation | |
| RAFAEL ESPINOSA LUNA EDGAR ENRIQUE CAMPS CARVAJAL DAGOBERTO CARDONA RAMIREZ ELDER DE LA ROSA | |
| Acceso Abierto | |
| Atribución-NoComercial-SinDerivadas | |
| A Mueller–Stokes analysis is applied to pure bismuth thin film samples prepared by the laser ablation technique by using a polarimeter with a 632.8 nm continuum wavelength laser. The complex refractive index is determined in the range of 250–1100 nm. Results from the Mueller matrix show the high sensitivity of diattenuation and polarizance parameters as a function of the sample thickness and the incidence angle, except at the pseudo-Brewster angle, where they exhibit the same value. Results show that the knowledge of the polarimetric response, with appropriate incident polarization states, could be used to design photonic Bi-based devices for several applications. Polarization dependence is the result of changes on the surface morphology as a result of the small value of the skin depth. | |
| 13-12-2012 | |
| Artículo | |
| CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA | |
| Aparece en las colecciones: | Articulos Arbitrados 2012 |
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|---|---|---|---|
| Polarimetric characterization of bismuth thin, Elder.pdf | 410.04 kB | Adobe PDF | Visualizar/Abrir |