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http://cio.repositorioinstitucional.mx/jspui/handle/1002/527| Three Gaussian Beam Interferometric Profilometer Applied to the Characterization of an Optical Flat | |
| MOISES CYWIAK GARBARCEWICZ MANUEL SERVIN GUIRADO JORGE MAURICIO FLORES MORENO | |
| Acceso Abierto | |
| Atribución-NoComercial-SinDerivadas | |
| A three-beam scanning optical interferometric microscopic technique applied to roughness characterization of optical flats is described. The technique is based on the heterodinization of three coherent optical beams. One of the beams, the probe beam, is focused on the surface under test. A second beam is obtained after being reflected by a reference surface. Finally, the last beam consists of one of the first orders of diffraction that emerges of a Bragg-cell. The three beams are coherently added at the sensitive surface of a photodetector that integrates the overall intensity of the beams. We show analytically that, the electrical signal at the output of the photodetector, is a time-varying signal whose amplitude is proportional to the surface local vertical height. We characterize experimentally the frequency response of the system by measuring the profile of three different gratings. We show measurements of the roughness of an optical flat processed by means of the frequency response of the system. | |
| 30-04-2007 | |
| Artículo | |
| CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA | |
| Aparece en las colecciones: | Articulos Arbitrados 2007 |
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| Fichero | Tamaño | Formato | |
|---|---|---|---|
| Three Gaussian beam interferometric profilometer applied to the characterization of an optical flat.pdf | 6.64 MB | Adobe PDF | Visualizar/Abrir |