Please use this identifier to cite or link to this item: http://cio.repositorioinstitucional.mx/jspui/handle/1002/1173
Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope
Jorge Mauricio Flores Moreno
MOISES CYWIAK GARBARCEWICZ
FERNANDO MENDOZA SANTOYO
Acceso Abierto
Atribución-NoComercial-SinDerivadas
We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions.
23-12-2009
Artículo
CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA
Appears in Collections:Articulos Arbitrados 2009

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