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http://cio.repositorioinstitucional.mx/jspui/handle/1002/1173| Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope | |
| Jorge Mauricio Flores Moreno MOISES CYWIAK GARBARCEWICZ FERNANDO MENDOZA SANTOYO | |
| Acceso Abierto | |
| Atribución-NoComercial-SinDerivadas | |
| We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions. | |
| 23-12-2009 | |
| Artículo | |
| CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA | |
| Aparece en las colecciones: | Articulos Arbitrados 2009 |
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| Overall characterization of assembled optical storage devices with a heterodyne microscope a qualitative comparison with a confocal microscope.pdf | 857.58 kB | Adobe PDF | Visualizar/Abrir |