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Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope | |
Jorge Mauricio Flores Moreno MOISES CYWIAK GARBARCEWICZ FERNANDO MENDOZA SANTOYO | |
Acceso Abierto | |
Atribución-NoComercial-SinDerivadas | |
We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions. | |
23-12-2009 | |
Artículo | |
CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA | |
Appears in Collections: | Articulos Arbitrados 2009 |
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